MT06000A (Discontinued)

Multistar™ Multi-Tone RF Radiated Immunity Test System, 65 MHz - 6 GHz. System includes a vector signal generator, vector signal analyzer, RF pre-amplifier, RF field probe and monitor, RF switch matrix, embedded computer, monitor, keyboard and automated immunity test software.

Complete Testing Solutions to the following standards:

  • EN/IEC 61000-4-3
  • EN/IEC 60601-1-2
  • EN 50130-4
  • EN 61000-6-1/2
  • EN 55024

The Model MT06000A (MultiStar™ Multi-Tone tester) is a state-of-the-art system designed to test RF Radiated Immunity faster than ever before possible. By testing multiple frequencies (tones) at once, test times can be reduced by a factor equivalent to the number of tones selected. The number of tones is only limited by the signal generator bandwidth (200MHz) and the size of the amplifier used with the system.

The MT06000A contains all the instruments needed to perform radiated immunity testing for IEC 61000-4-3 specification except the required amplifiers, antennas, and directional couplers. Amplifiers can be sized and selected based on your required field levels and testing needs.

Up to 4 RF amplifiers and directional couplers can be controlled and monitored and power can be delivered to up to 4 antennas to generate the desired fields. The system contains a vector signal generator, a vector signal analyzer, an RF pre-amplifier, an RF field probe and monitor, an RF switch matrix, and automated radiated immunity test software.

Everything is contained in a single housing, which eliminates setup issues. The software includes automated routines to calibrate the field and maximize the speed of the test (most tones possible) while still meeting the Linearity and Harmonics requirements of the specification.

In the event of a EUT failure, margin investigation (thresholding) and traditional single tone testing can be performed causing a slowing of the test only in the areas of concern. This system has the versatility needed for every test laboratory and equipment manufacturer while adding the benefit of reduced test times and greater throughput.