Testing the Life Expectancy of RF Front-end Components (HTOL Systems and Burn-In Testing)


Wireless front-end components are potentially subjected to high-stress levels. Because of this, operational RF drive levels and currents exacerbate the potential for failure. Additionally, connection to an antenna permits to ingress of external energy. Manufacturing variance and defect can contribute to the possible life span. These aspects require specialized testing to capture both early failures and long-term wear-out. This presentation will consider the parameters and equipment necessary to accurately specify Mean Time to Failure (MTTF) and capture Early Failure Rate (EFR).